| Time | Title | Content | References (Assignments) | ||||
| PCT | PDR | CTP | UHS | ||||
| 1 | July 21 | Introduction | Principles, Milestones, Applications | 1 | |||
| "Hard" Part | |||||||
| 2 | July 23 | Physics | X-Rays, Interactions With Material | 2, 4 | |||
| 3 | July 28 | Sources & Detectors | Source, Detectors | 2 | 3 | ||
| 4 | July 30 | Data Acquisition | Attenuation, Preprocessing | 2 | 5 | 5 | |
| 5 | Aug 4 | Scanning Modes | Five Generations, Spiral, Cone-Beam Modes | 2 | 10 | ||
| 6 | Aug 6 | CT Scanners | System Configuration, Ultra-Fast Scanners | 2 | 8 | ||
| 7 | Aug 11 | Test | |||||
| "Soft" Part | |||||||
| 8 | Aug 13 | Mathematics | Linear Equations, Fourier Analysis | ||||
| 9 | Aug 18 | Signal Processing | Computers, Signal Digitization, Algorithms | 2, 3 | |||
| 10 | Aug 20 | Image Reconstruction: Filtered Backprojection | Fourier Inversion, Filtered Backprojection | 7 | 19 | 7 | |
| 11 | Aug 25 | Image Reconstruction: Iterative Reconstruction | ART (Additive), EM (Multiplicative) | 19 | 7 | ||
| 12 | Aug 27 | Spiral CT | Full-Scan Interpolation, Half-Scan Interpolation | 6 | UHS | ||
| 13 | Sept 1 | Test | |||||
| "Tech" Part | |||||||
| 14 | Sept 3 | Image Resolution | Temporal Resolution, High-Contrast Resolution, Low-Contrast Resolution | 8 | 11 | ||
| 15 | Sept 10 | Image Artifacts | Beam-Hardening, Blurring, Stair-Step, Metal, Truncation, Motion | 11, 12 | 11 | ||
| 16 | Sept 15 | Imaging Parameters | Voltage, Current, Collimation, Feed, Pitch, Zoom, z Interval | 5, 6, 10 | 11 | ||
| 17 | Sept 17 | Quality Assurance | Phantoms, Various Tests | 13 | |||
| 18 | Sept 22 | Radiation Safety | Dose Indexes, Measurement | 4 | 12 | ||
| 19 | Sept 24 | Manufacturers | GE, Siemens, Toshiba, Picker, Elscint, Phillip, Analogic, Imatron, Future Trends | 13 | |||
| 20 | Sept 29 | Test | |||||